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400-1100nm silicon-based bias photodetector - high-speed type
400-1100nm silicon-based bias photodetector - high-speed type
Xiaoxiao Photon's high-speed silicon-based biased photodetector covers a photosensitive range of 400nm~1100nm, with extremely low noise, fast response, no gain, low cost, suitable for conventional optoelectronic detection applications, excellent performance, high cost-effectiveness, and provides Quan directional technical support. It is commonly used for visible and infrared light measurement. Product features: The photosensitive range covers 400nm~1100nm and is commonly used as a bias type detector for visible and near-infrared light measurement. It has extremely low noise, fast response, no gain and low cost, and is suitable for measuring the intensity time waveform of high-speed laser pulses or emission events. It has excellent performance and high cost-effectiveness, and can provide non-standard customized services. Application areas: Visible light and infrared light measurement. Main parameters: parameter value input coupling method, window plate ball lens FC/PC fiber holder wavelength range of 400-1100nm, peak wavelength 730nm, peak response 0.46A/W3dB bandwidth (@ 50 Ω) 2Ghz1GHz rise/fall time (@ 50 Ω) 150ps/150ps1ns/1ns NEP9.29 × 10-15W/Hz 1/29.5 × 10-15dB 5W/Hz 1/2 dark current 35pA126pA output voltage 2V (Max...)
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400-1100nm High-speed Silicon-based Bias Photodetector, Active Area Φ250um, Rise Time 150ps
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400-1100nm High-speed silicon-based biased photodetector, Active Area Φ250μm, rise time 1ns
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400-1100nm High-speed Silicon-based Bias Photodetector Sensitive Area Φ250um, Rise Time 150ps, Bandwidth 2GHz Input Coupling Method: Window piece
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400-1100nm High-speed Silicon-based Bias Photodetector, Input Coupling Method: Ball lens
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